Physical Chemistry at Interfaces, advanced structural characterization

The first objective of this research line is to control the growth of oxide thin films and nanostructures at the atomic level by investigating the growth mechanisms and kinetics at the early stage. For that purpose, we develop and use experimental means and methods for carrying in situ structural and chemical characterizations, i.e. during the synthesis. The second objective concerns advanced structural and chemical characterizations of nanostructures and nanomaterials either ex situ or in situ upon variations of external parameters (temperature, oxygen pressure, ...)

To visualize the early stage of growth and the evolution of nanostructures, in situ, with multiprobe techniques, including synchrotron radiation based techniques ... 

To use or develop advanced X-ray techniques for structural and chemical characterization of nanostructures, either ex situ or in situ. Examples are MAD, DAFS ...