LMGP Seminar - 05/07/2016 - Asylum: Rafaël Barbattini et Julien Lopez

Beyond Topography: New Advances in AFM Characterization (PFM, Conductive AFM, Electrical modes and nanomechanics)

Rafaël Barbattini and Julien Lopez Application Scientist and sales engineer
Asylum Research an Oxford Instruments Company



Whether investigating fundamental research principles or engineering a specific product, the atomic force microscope (AFM) is a key instrument for both materials and life science applications. Its spatial resolution enables visualization of sub-micrometer and sub-nanometer morphology and structure. However, recent advances mean that AFMs can also measure the physical properties and functional behavior of large range of different samples. In addition to familiar topographic imaging, AFMs can probe molecular-level forces, map mechanical, thermal, and electrical properties and assess solvent and thermal effects in near real time. This seminar provides an overview of the AFM’s powerful capabilities for different type of characterization and will cover:

  • ·         Asylum AFMs’ general presentation
  • ·         Recent advances in PFM, conductive AFM and electrical modes     
  • ·         Nanomechanical mapping
  • ·         On site demo at ESRF 

Date infos
Grenoble INP - Phelma
Laboratoire LMGP
3 parvis Louis Néel - 38000 Grenoble
Accès : TRAM B arrêt Cité internationale
Free entrance - No registration
Location infos
10:00 h - 2ème étage - salle de séminaire